Effect of Ni–Sn electrode on insulation resistance degradation in BaTiO3-based multi-layer ceramic capacitors
Tomoyuki Nakamura, Shinichi Yamaguchi, Daisuke Hamada, Atsushi Honda +2
AI summary
75% confidenceThis study investigates how adding Tin (Sn) to Nickel internal electrodes in BaTiO3-based multi-layer ceramic capacitors mitigates leakage current degradation as dielectric layers become thinner. By combining high-resolution interfacial observations with analytical and computational methods, the research clarifies that Sn addition modifies the electrode's work function to suppress insulation degradation.
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Abstract
As the BaTiO3 dielectric layer of multi-layer ceramic capacitors becomes thinner, the problem of leakage current degradation arises. In this study, the relationship between the Sn content in Ni–Sn internal electrodes and reliability enhancement is clarified. In addition, based on high-resolution interfacial observations, changes in the work function of the Ni–Sn internal electrode are examined to investigate the mechanism of insulation degradation suppression. Determination of the work function is conducted using both analytical and computational approaches. From these results, the mechanism by which Sn addition to Ni internal electrodes suppresses insulation degradation is discussed.
Key findings
- Increasing Sn content in Ni–Sn internal electrodes enhances the reliability of BaTiO3-based MLCCs by reducing leakage current degradation.
- High-resolution observations reveal that Sn addition alters the interfacial properties between the electrode and dielectric layer.
- The suppression of insulation degradation is directly linked to changes in the work function of the Ni–Sn internal electrode.
Keywords
Identifiers
- Journal
- Applied Physics Letters
- Year
- 2026